Characterization of 8 fs deep-UV pulses using XPW dispersion scan

verfasst von

Ayhan Tajalli, Thomas K. Kalousdian, Martin Kretschmar, Sven Kleinert, Uwe Morgner, Tamas Nagy

Abstract

The measurement of few-fs-long deep-ultraviolet (DUV) pulses is one of the most demanding tasks for optical pulse characterization as these pulses are very much prone to material dispersion and space-time distortions. Therefore, the arrangements should be very carefully designed not to deteriorate the pulses in the course of the measurement. Furthermore, in this wavelength range the most popular nonlinearities used for the characterization such as second harmonic or sum frequency generation processes become unpractical or even unfeasible due to the very limited phase-matching or the even shorter wavelength of the resulted signal. Consequently, up to now most of short UV pulses were characterized by the FROG technique utilizing a degenerate four-wave mixing process, such as self diffraction [1] or transient grating formation [2]. Nevertheless, this technique suffers from rather bad signal to noise ratio and low sensitivity due to wave front splitting necessary for such method.

Organisationseinheit(en)

Institut für Quantenoptik
PhoenixD: Simulation, Fabrikation und Anwendung optischer Systeme
Hannoversches Zentrum für Optische Technologien (HOT)

Externe Organisation(en)

Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (MBI)
Laser Zentrum Hannover e.V. (LZH)

Typ

Aufsatz in Konferenzband

Anzahl der Seiten

1

Publikationsdatum

06.2019

Publikationsstatus

Veröffentlicht

Peer-reviewed

Ja

ASJC Scopus Sachgebiete

Spektroskopie, Elektronische, optische und magnetische Materialien, Instrumentierung, Atom- und Molekularphysik sowie Optik, Computernetzwerke und -kommunikation

Elektronische Version(en)

https://doi.org/10.1109/CLEOE-EQEC.2019.8871814 (Zugang: Geschlossen)