Characterization of 8 fs deep-UV pulses using XPW dispersion scan

authored by

Ayhan Tajalli, Thomas K. Kalousdian, Martin Kretschmar, Sven Kleinert, Uwe Morgner, Tamas Nagy

Abstract

The measurement of few-fs-long deep-ultraviolet (DUV) pulses is one of the most demanding tasks for optical pulse characterization as these pulses are very much prone to material dispersion and space-time distortions. Therefore, the arrangements should be very carefully designed not to deteriorate the pulses in the course of the measurement. Furthermore, in this wavelength range the most popular nonlinearities used for the characterization such as second harmonic or sum frequency generation processes become unpractical or even unfeasible due to the very limited phase-matching or the even shorter wavelength of the resulted signal. Consequently, up to now most of short UV pulses were characterized by the FROG technique utilizing a degenerate four-wave mixing process, such as self diffraction [1] or transient grating formation [2]. Nevertheless, this technique suffers from rather bad signal to noise ratio and low sensitivity due to wave front splitting necessary for such method.

Organisation(s)

Institute of Quantum Optics
PhoenixD: Photonics, Optics, and Engineering - Innovation Across Disciplines
Hannover Centre for Optical Technologies (HOT)

External Organisation(s)

Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy im Forschungsbund Berlin e.V. (MBI)
Laser Zentrum Hannover e.V. (LZH)

Type

Conference contribution

No. of pages

1

Publication date

06.2019

Publication status

Published

Peer reviewed

Yes

ASJC Scopus subject areas

Spectroscopy, Electronic, Optical and Magnetic Materials, Instrumentation, Atomic and Molecular Physics, and Optics, Computer Networks and Communications

Electronic version(s)

https://doi.org/10.1109/CLEOE-EQEC.2019.8871814 (Access: Closed)