Full characterization of 8 fs deep UV pulses via a dispersion scan

verfasst von

Ayhan Tajalli, Thomas K. Kalousdian, Martin Kretschmar, Sven Kleinert, Uwe Morgner, Tamas Nagy

Abstract

We report on, to the best of our knowledge, the first characterization of deep ultraviolet (UV) pulses by the dispersion scan (d-scan) technique. Negatively chirped 8 fs deep UV pulses are generated via the phase transfer of shaped few-cycle near-infrared pulses in a sum frequency generation process with narrowband second harmonic. The pulses are characterized by a d-scan technique incorporating a cross-polarized wave (XPW) generation nonlinearity. Being a single-beam degenerate four-wave mixing process, XPW does not acquire frequency conversion and, thus, is ideally suited for characterizing pulses in the UV, where the material dispersion severely limits phase matching. The characterization method is benchmarked by measuring the dispersion effect of a known fused silica plate on the pulses.

Organisationseinheit(en)

Institut für Quantenoptik
PhoenixD: Simulation, Fabrikation und Anwendung optischer Systeme

Externe Organisation(en)

Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (MBI)
Laser Zentrum Hannover e.V. (LZH)

Typ

Artikel

Journal

Optics Letters

Band

44

Seiten

2498-2501

Anzahl der Seiten

4

ISSN

0146-9592

Publikationsdatum

15.05.2019

Publikationsstatus

Veröffentlicht

Peer-reviewed

Ja

ASJC Scopus Sachgebiete

Atom- und Molekularphysik sowie Optik

Elektronische Version(en)

https://doi.org/10.1364/ol.44.002498 (Zugang: Geschlossen)