Full characterization of 8 fs deep UV pulses via a dispersion scan

authored by

Ayhan Tajalli, Thomas K. Kalousdian, Martin Kretschmar, Sven Kleinert, Uwe Morgner, Tamas Nagy

Abstract

We report on, to the best of our knowledge, the first characterization of deep ultraviolet (UV) pulses by the dispersion scan (d-scan) technique. Negatively chirped 8 fs deep UV pulses are generated via the phase transfer of shaped few-cycle near-infrared pulses in a sum frequency generation process with narrowband second harmonic. The pulses are characterized by a d-scan technique incorporating a cross-polarized wave (XPW) generation nonlinearity. Being a single-beam degenerate four-wave mixing process, XPW does not acquire frequency conversion and, thus, is ideally suited for characterizing pulses in the UV, where the material dispersion severely limits phase matching. The characterization method is benchmarked by measuring the dispersion effect of a known fused silica plate on the pulses.

Organisation(s)

Institute of Quantum Optics
PhoenixD: Photonics, Optics, and Engineering - Innovation Across Disciplines

External Organisation(s)

Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy im Forschungsbund Berlin e.V. (MBI)
Laser Zentrum Hannover e.V. (LZH)

Type

Article

Journal

Optics Letters

Volume

44

Pages

2498-2501

No. of pages

4

ISSN

0146-9592

Publication date

15.05.2019

Publication status

Published

Peer reviewed

Yes

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

Electronic version(s)

https://doi.org/10.1364/ol.44.002498 (Access: Closed)