Experimental Demonstration of Surface Plasmon Polaritons Reflection and Transmission Effects

authored by: Lei Zheng, Urs Zywietz, Andrey Evlyukhin, Bernhard Roth, Ludger Overmeyer, Carsten Reinhardt
Abstract: Special integrated photonic surface structures composed of a dielectric semicircle ridge and a dielectric block placed on a metal substrate are proposed for the investigation of surface plasmon polariton (SPP) reflection and transmission effects. A fabrication method called microscope projection photolithography was employed for the preparation of the structures. Leakage radiation microscopy was applied for the excitation and observation of surface plasmon polaritons (SPPs). It was observed that SPPs exhibit a remarkable decrease in intensity when impinging onto the rectangular dielectric block. Nevertheless, the transmitted wave out of the dielectric block was always observable. The propagation behavior of both the reflected waves at two boundaries (air/dielectric and dielectric/air) and the transmitted wave inside the dielectric block were demonstrated for different SPP incident conditions. The variation of the angles of reflection and transmission with respect to the incident angle was analytically and experimentally investigated. An agreement between the calculated results and the experimental results was obtained. Our findings might allow for novel applications in sensing and analytics once the structures will be functionalized.
Organisation(s): PhoenixD: Photonics, Optics, and Engineering - Innovation Across Disciplines
Hannover Centre for Optical Technologies (HOT)
Institute of Quantum Optics
Institute of Transport and Automation Technology
External Organisation(s): Laser Zentrum Hannover e.V. (LZH)
Bremen University of Applied Sciences
Type: Article
Journal: Sensors (Switzerland)
Volume: 19
ISSN: 1424-8220
Publication date: 01.11.2019
Publication status: Published
Peer reviewed: Yes
ASJC Scopus subject areas: Analytical Chemistry, Biochemistry, Atomic and Molecular Physics, and Optics, Instrumentation, Electrical and Electronic Engineering
Electronic version(s): https://doi.org/10.3390/s19214633 (Access: Open)
https://doi.org/10.15488/8797 (Access: Open)